Adlink Technology named as finalist in the Best in Test awards

Adlink Technology announced that Test & Measurement World has named its PXIe-9848 8-CH 14-bit 100 MS/s high-speed PXI Express digitiser as a finalist in the Best in Test Awards competition. The Best in Test Product Awards honour important and innovative new products and services in the electronics test and measurement industry. Products from all areas of electronics testing and inspection are eligible.

"We're honoured to be recognised among the many elite products nominated for the Best in Test Awards competition," said Catherine Wu, product director of Adlink's Measurement and Automation Product Segment. "The PXIe-9848's top-of-the-line performance enables the digitiser to meet and exceed customer needs for sampling complicated QC test parameters - including rise time, overshoot, turn-on delay, and many others - providing our customers with a cost- and feature-optimised digitiser solution."

The PXIe-9848 is an 8-channel, 14-bit, 100 MS/s digitiser delivering both high-accuracy measurement results and high-dynamic performance. With a PXI Express bus interface and ample onboard acquisition memory up to 512 MB, the PXIe-9848 can easily manage simultaneous 8-CH data streaming. High-density and high-speed digitiser features position the PXIe-9848 for applications such as LIDAR, radar signal acquisition and power supply unit (PSU) testing applications.

"Since 1991 we have had the annual tradition of selecting the Best in Test Award winners," said Janine Love, Editor in Chief, Test & Measurement World, UBM Tech. "We received an outstanding group of new innovative products and services this year. We look forward to hearing what our readers think of these selections and which products they believe will define our industry for years to come."

Also included in the competition is an annual Test of Time Award, presented to a product that continues to provide state-of-the-art service more than five years after its introduction, and Test Engineer of the Year Award, which pays tribute to the important contributions test engineers make to the quality of electronics components, products and systems. The award winner receives a $10,000 educational grant, which is presented to an engineering school designated by the winner.

Winners will be announced 31 January 2013.